arrow
Volume 9, Issue 2
Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems

Xiaoping Fang, Youjun Deng & Xiaohong Chen

East Asian J. Appl. Math., 9 (2019), pp. 280-294.

Published online: 2019-03

Export citation
  • Abstract

An inverse problem to recover small inclusions inside a two-layer structure is considered. Integral representations for the solution of two-layer inhomogeneous conductivity problem are derived and asymptotic expansions of a perturbed electrical field are obtained. Moreover, the uniqueness of the recovery of the locations and conductivities of small inclusions is proved.

  • AMS Subject Headings

35J05, 31B40, 35R30

  • Copyright

COPYRIGHT: © Global Science Press

  • Email address
  • BibTex
  • RIS
  • TXT
@Article{EAJAM-9-280, author = {Xiaoping Fang, Youjun Deng and Xiaohong Chen}, title = {Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems}, journal = {East Asian Journal on Applied Mathematics}, year = {2019}, volume = {9}, number = {2}, pages = {280--294}, abstract = {

An inverse problem to recover small inclusions inside a two-layer structure is considered. Integral representations for the solution of two-layer inhomogeneous conductivity problem are derived and asymptotic expansions of a perturbed electrical field are obtained. Moreover, the uniqueness of the recovery of the locations and conductivities of small inclusions is proved.

}, issn = {2079-7370}, doi = {https://doi.org/10.4208/eajam.030518.210918}, url = {http://global-sci.org/intro/article_detail/eajam/13083.html} }
TY - JOUR T1 - Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems AU - Xiaoping Fang, Youjun Deng & Xiaohong Chen JO - East Asian Journal on Applied Mathematics VL - 2 SP - 280 EP - 294 PY - 2019 DA - 2019/03 SN - 9 DO - http://doi.org/10.4208/eajam.030518.210918 UR - https://global-sci.org/intro/article_detail/eajam/13083.html KW - Electrical impedance tomography, small inclusion, inverse problem, uniqueness. AB -

An inverse problem to recover small inclusions inside a two-layer structure is considered. Integral representations for the solution of two-layer inhomogeneous conductivity problem are derived and asymptotic expansions of a perturbed electrical field are obtained. Moreover, the uniqueness of the recovery of the locations and conductivities of small inclusions is proved.

Xiaoping Fang, Youjun Deng and Xiaohong Chen. (2019). Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems. East Asian Journal on Applied Mathematics. 9 (2). 280-294. doi:10.4208/eajam.030518.210918
Copy to clipboard
The citation has been copied to your clipboard