TY - JOUR
T1 - Reconstruction of Small Inclusions in Electrical Impedance Tomography Problems
AU - Xiaoping Fang, Youjun Deng & Xiaohong Chen
JO - East Asian Journal on Applied Mathematics
VL - 2
SP - 280
EP - 294
PY - 2019
DA - 2019/03
SN - 9
DO - http://doi.org/10.4208/eajam.030518.210918
UR - https://global-sci.org/intro/article_detail/eajam/13083.html
KW - Electrical impedance tomography, small inclusion, inverse problem, uniqueness.
AB - <p style="text-align: justify;">An inverse problem to recover small inclusions inside a two-layer structure is
considered. Integral representations for the solution of two-layer inhomogeneous conductivity problem are derived and asymptotic expansions of a perturbed electrical field
are obtained. Moreover, the uniqueness of the recovery of the locations and conductivities of small inclusions is proved.</p>